화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Investigation of charge-trap memories with AlN based band engineered storage layers
Molas G, Colonna JP, Kies R, Belhachemi D, Bocquet M, Gely M, Vidal V, Brianceau P, Martinez E, Papon AM, Licitra C, Vandroux L, Ghibaudo G, De Salvo B
Solid-State Electronics, 58(1), 68, 2011
2 Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories
Bocquet M, Molas G, Perniola L, Garros X, Buckley J, Gely M, Colonna JP, Grampeix H, Martin F, Vidal V, Toffoli A, Deleonibus S, Ghibaudo G, Pananakakis G, De Salvo B
Solid-State Electronics, 53(7), 786, 2009
3 Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories
Molas G, Bocquet M, Buckley J, Grampeix H, Gely M, Colonna JP, Licitra C, Rochat N, Veyront T, Garros X, Martin F, Brianceau P, Vidal V, Bongiorno C, Lombardo S, De Salvo B, Deleonibus S
Solid-State Electronics, 51(11-12), 1540, 2007