검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Detailed 8-transistor SRAM cell analysis for improved alpha particle radiation hardening in nanometer technologies Bota SA, Torrens G, Verd J, Segura J Solid-State Electronics, 111, 104, 2015 |
| 2 |
Paramagnetic Defect Generation and Microstructure Change in Porous Low-k SiOCH Films with Vacuum Baking Tanbara K, Kamigaki Y Journal of the Electrochemical Society, 157(4), G95, 2010 |
| 3 |
Stress induced leakage current under pulsed voltage stress Cester A, Paccagnella A, Ghidini G Solid-State Electronics, 46(3), 399, 2002 |
| 4 |
Soft breakdown current noise in ultra-thin gate oxides Cester A, Bandiera L, Ghidini G, Bloom I, Paccagnella A Solid-State Electronics, 46(7), 1019, 2002 |
| 5 |
Analytical model for extrinsic time-dependent dielectric breakdown of thin gate oxide Katto H Solid-State Electronics, 46(9), 1265, 2002 |