검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Atomic and Mesoscopic Scale Characterization of Semiconductor Interfaces by Ballistic-Electron-Emission Microscopy Lee EY, Bhargava S, Chin MA, Narayanamurti V Journal of Vacuum Science & Technology A, 15(3), 1351, 1997 |
| 2 |
Measurement of Heterojunction Band Offsets Using Ballistic-Electron-Emission Microscopy Oshea JJ, Sajoto T, Bhargava S, Leonard D, Chin MA, Narayanamurti V Journal of Vacuum Science & Technology B, 12(4), 2625, 1994 |