화학공학소재연구정보센터
검색결과 : 14건
No. Article
1 Temperature dependence of charge transport in zinc oxide nanosheet source-gated transistors
Dahiya AS, Opoku C, Cayrel F, Valente D, Poulin-Vittrant G, Camara N, Alquier D
Thin Solid Films, 617, 114, 2016
2 Optical nano-imaging of gate-tunable graphene plasmons
Chen JN, Badioli M, Alonso-Gonzalez P, Thongrattanasiri S, Huth F, Osmond J, Spasenovic M, Centeno A, Pesquera A, Godignon P, Elorza AZ, Camara N, de Abajo FJG, Hillenbrand R, Koppens FHL
Nature, 487(7405), 77, 2012
3 Rapid Growth of Oxide Films on SiC by Photo-Assisted Mechanism
Constant A, Camara N, Montserrat J, Camassel J, Godignon P
Electrochemical and Solid State Letters, 14(6), G42, 2011
4 Interfacial Properties of Oxides Grown on 3C-SiC by Rapid Thermal Processing
Constant A, Camara N, Placidi M, Decams JM, Camassel J, Godignon P
Journal of the Electrochemical Society, 158(1), G13, 2011
5 Effects of Photons on 4H-SiC Rapid Thermal Oxidation Using Nitrous Oxide Gas
Constant A, Camara N, Godignon P, Placidi M, Perez-Tomas A, Camassel J
Journal of the Electrochemical Society, 157(6), G136, 2010
6 Nanostructuring of epitaxial graphene layers on SiC by means of field-induced atomic force microscopy modification
Rius G, Camara N, Godignon P, Perez-Murano F, Mestres N
Journal of Vacuum Science & Technology B, 27(6), 3149, 2009
7 Characterisation of 4H-SiC pin diodes by micro-Raman scattering and photoemission
Thuaire A, Mermoux M, Crisci A, Camara N, Bano E, Baillet F, Pernot E
Materials Science Forum, 483, 437, 2005
8 Forward-bias degradation in 4H-SiC p(+)nn(+) diodes: Influence of the mesa etching
Camara N, Thuaire A, Bano E, Zekentes K
Materials Science Forum, 483, 773, 2005
9 Investigation of microwave switching 4HSiC p-i-n diodes in the 20 divided by 500 degrees C temperature range
Boltovets MS, Basanets VV, Camara N, Krivutsa VA, Zekentes K
Materials Science Forum, 483, 997, 2005
10 Theoretical investigations of the microwave characteristics of TUNNETT diodes made of silicon carbide
Buniatyan VV, Aroutiounian VM, Zekentes K, Camara N, Soukiassian P
Materials Science Forum, 457-460, 977, 2004