화학공학소재연구정보센터
검색결과 : 7건
No. Article
1 Imaging individual barium atoms in solid xenon for barium tagging in nEXO
Chambers C, Walton T, Fairbank D, Craycraft A, Yahne DR, Todd J, Iverson A, Fairbank W, Alamre A, Albert JB, Anton G, Arnquist IJ, Badhrees I, Barbeau PS, Beck D, Belov V, Bhatta T, Bourque F, Brodsky JP, Brown E, Brunner T, Burenkov A, Cao GF, Cao L, Cen WR, Charlebois SA, Chiu M, Cleveland B, Coon M, Cote M, Cree W, Dalmasson J, Daniels T, Darroch L, Daugherty SJ, Daughhetee J, Delaquis S, Mesrobian-Kabakian AD, DeVoe R, Dilling J, Ding YY, Dolinski MJ, Dragone A, Echevers J, Fabris L, Farine J, Feyzbakhsh S, Fontaine R, Fudenberg D, Gallina G, Giacomini G, Gornea R, Gratta G, Hansen EV, Heffner M, Hoppe EW, Hossl J, House A, Hufschmidt P, Hughes M, Ito Y, Jamil A, Jessiman C, Jewell MJ, Jiang XS, Karelin A, Kaufman LJ, Kodroff D, Koffas T, Kravitz S, Krucken R, Kuchenkov A, Kumar KS, Lan Y, Larson A, Leonard DS, Li G, Li S, Li Z, Licciardi C, Lin YH, Lv P, MacLellan R, Michel T, Mong B, Moore DC, Murray K, Newby RJ, Ning Z, Njoya O, Nolet F, Nusair O, Odgers K, Odian A, Oriunno M, Orrell JL, Ortega GS, Ostrovskiy I, Overman CT, Parent S, Piepke A, Pocar A, Pratte JF, Qiu D, Radeka V, Raguzin E, Rao T, Rescia S, Retiere F, Robinson A, Rossignol T, Rowson PC, Roy N, Saldanha R, Sangiorgio S, Schmidt S, Schneider J, Schubert A, Skarpaas K, Soma AK, St-Hilaire G, Stekhanov V, Stiegler T, Sun XL, Tarka M, Tolba T, Totev TI, Tsang R, Tsang T, Vachon F, Veenstra B, Veeraraghavan V, Visser G, Vuilleumier JL, Wagenpfeil M, Wang Q, Watkins J, Weber M, Wei W, Wen LJ, Wichoski U, Wrede G, Wu SX, Wu WH, Xia Q, Yang L, Yen YR, Zeldovich O, Zhang X, Zhao J, Zhou Y, Ziegler T
Nature, 569(7755), 203, 2019
2 Search for Majorana neutrinos with the first two years of EXO-200 data
Albert JB, Auty DJ, Barbeau PS, Beauchamp E, Beck D, Belov V, Benitez-Medina C, Bonatt J, Breidenbach M, Brunner T, Burenkov A, Cao GF, Chambers C, Chaves J, Cleveland B, Coon M, Craycraft A, Daniels T, Danilov M, Daugherty SJ, Davis CG, Davis J, Devoe R, Delaquis S, Didberidze T, Dolgolenko A, Dolinski MJ, Dunford M, Fairbank W, Farine J, Feldmeier W, Fierlinger P, Fudenberg D, Giroux G, Gornea R, Graham K, Gratta G, Hall C, Herrin S, Hughes M, Jewell MJ, Jiang XS, Johnson A, Johnson TN, Johnston S, Karelin A, Kaufman LJ, Killick R, Koffas T, Kravitz S, Kuchenkov A, Kumar KS, Leonard DS, Leonard F, Licciardi C, Lin YH, MacLellan R, Marino MG, Mong B, Moore D, Nelson R, Odian A, Ostrovskiy I, Ouellet C, Piepke A, Pocar A, Prescott CY, Rivas A, Rowson PC, Rozo MP, Russell JJ, Schubert A, Sinclair D, Slutsky S, Smith E, Stekhanov V, Tarka M, Tolba T, Tosi D, Twelker K, Vogel P, Vuilleumier JL, Waite A, Walton J, Walton T, Weber M, Wen LJ, Wichoski U, Wright JD, Yang L, Yen YR, Zeldovich OY, Zhao YB
Nature, 510(7504), 229, 2014
3 Suppression of cooling by strong magnetic fields in white dwarf stars
Valyavin G, Shulyak D, Wade GA, Antonyuk K, Zharikov SV, Galazutdinov GA, Plachinda S, Bagnulo S, Machado LF, Alvarez M, Clark DM, Lopez JM, Hiriart D, Han I, Jeon YB, Zurita C, Mujica R, Burlakova T, Szeifert T, Burenkov A
Nature, 515(7525), 88, 2014
4 On the influence of RTA and MSA peak temperature variations on Schottky contact resistances of 6-T SRAM cells
Kampen C, Burenkov A, Pichler P, Lorenz J
Solid-State Electronics, 65-66, 114, 2011
5 Impact of carbon junction implant on leakage currents and defect distribution: Measurement and simulation
Roll G, Jakschik S, Burenkov A, Goldbach M, Mikolajick T, Frey L
Solid-State Electronics, 65-66, 170, 2011
6 Future challenges in CMOS process modeling
Pichler P, Burenkov A, Lorenz J, Kampen C, Frey L
Thin Solid Films, 518(9), 2478, 2010
7 Optimization of 0.18 mu m CMOS devices by coupled process and device simulation
Burenkov A, Tietzel K, Lorenz J
Solid-State Electronics, 44(5), 767, 2000