검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Secondary ion mass spectrometry and x-ray photoelectron spectroscopy correlation study of nitrided gate oxide Bradbury CA, Blackmer C Journal of Vacuum Science & Technology A, 18(4), 1056, 2000 |
| 2 |
Adhesion effect of polyimide passivation layer on lead-on-chip die attachment Jiang TT, Bradbury CA, Canavan M Journal of Vacuum Science & Technology A, 18(4), 1102, 2000 |
| 3 |
Tungsten silicide composition analysis by Rutherford backscattering spectroscopy, Auger electron spectroscopy, and x-ray photoelectron spectroscopy Bradbury CA, Fillmore DK Journal of Vacuum Science & Technology A, 16(3), 1103, 1998 |