검색결과 : 2건
No. | Article |
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1 |
Study of the Adhesion Between A-CH Films and Ta6V Substrates by Electron-Induced X-Ray-Emission Spectroscopy (Exes) Jonnard P, Tixier C, Desmaison J, Hombourger C, Bonnelle C Thin Solid Films, 306(1), 119, 1997 |
2 |
Characterization of Silicon Oxynitride Thin-Films by Infrared Reflection-Absorption Spectroscopy Firon M, Bonnelle C, Mayeux A Journal of Vacuum Science & Technology A, 14(4), 2488, 1996 |