화학공학소재연구정보센터
검색결과 : 13건
No. Article
1 Si-SiC core-shell nanowires
Ollivier M, Latu-Romain L, Martin M, David S, Mantoux A, Bano E, Souliere V, Ferro G, Baron T
Journal of Crystal Growth, 363, 158, 2013
2 Investigation of localized versus uniform strain as a performance booster in InAs Tunnel-FETs
Conzatti F, Pala MG, Esseni D, Bano E
Solid-State Electronics, 88, 49, 2013
3 Characterisation of 4H-SiC pin diodes by micro-Raman scattering and photoemission
Thuaire A, Mermoux M, Crisci A, Camara N, Bano E, Baillet F, Pernot E
Materials Science Forum, 483, 437, 2005
4 Forward-bias degradation in 4H-SiC p(+)nn(+) diodes: Influence of the mesa etching
Camara N, Thuaire A, Bano E, Zekentes K
Materials Science Forum, 483, 773, 2005
5 Current transport mechanisms in 4H-SiC pin diodes.
Camara N, Bano E, Zekentes K
Materials Science Forum, 457-460, 1017, 2004
6 QuaSiC Smart-Cut (R) substrates for SiC high power devices
Letertre F, Jalaguier E, Di Cioccio L, Templier F, Bluet JM, Banc C, Matko I, Chenevier B, Bano E, Guillot G, Billon T, Aspar B, Madar R, Ghyselen B
Materials Science Forum, 389-3, 151, 2002
7 Photon emission analysis of defect-free 4H-SiC pn diodes in avalanche regime
Banc C, Bano E, Ouisse T, Vassilevski K, Zekentes K
Materials Science Forum, 389-3, 1293, 2002
8 4H-SiC IMPATT diode fabrication and testing
Vassilevski KV, Zorenko AV, Zekentes K, Tsagaraki K, Bano E, Banc C, Lebedev AA
Materials Science Forum, 389-3, 1353, 2002
9 Hot-carrier luminescence in 4H-SiC MESFETs
Banc C, Bano E, Ouisse T, Noblanc O, Brylinski C
Materials Science Forum, 389-3, 1371, 2002
10 SiC power devices on QUASIC and SiCOI Smart-Cut (R) substrates: First demonstrations
Letertre F, Daval N, Templier F, Bano E, Planson D, Di Ciocco L, Jalaguier E, Bluet JM, Billon T, Madar R, Chante JP
Materials Science Forum, 433-4, 813, 2002