검색결과 : 13건
No. | Article |
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1 |
Nanocalorimetry study of the evolution of melting characteristics of single layer silver alkanethiolate lamella: Fast heating/cooling and electrical annealing Ye ZC, de la Rama LP, Hu L, Efremov MY, Allen LH Thermochimica Acta, 603, 69, 2015 |
2 |
Anomalous transitions of DODAB using fast scanning liquid calorimetry de la Rama LP, Hu L, Efremov MY, Olson EA, Nealey PF, McLean MA, Sligar SG, Allen LH Thermochimica Acta, 522(1-2), 72, 2011 |
3 |
Fabrication, characterization and modeling of single-crystal thin film calorimeter sensors Anahory Y, Guihard M, Smeets D, Karmouch R, Schiettekatte F, Vasseur P, Desjardins P, Hu LA, Allen LH, Leon-Gutierrez E, Rodriguez-Viejo J Thermochimica Acta, 510(1-2), 126, 2010 |
4 |
Self-Assembly and Ripening of Polymeric Silver-Alkanethiolate Crystals on Inert Surfaces Hu L, Zhang ZS, Zhang M, Efremov MY, Olson EA, de la Rama LP, Kummamuru RK, Allen LH Langmuir, 25(16), 9585, 2009 |
5 |
Probing glass transition of ultrathin polymer films at a time scale of seconds using fast differential scanning calorimetry Efremov MY, Olson EA, Zhang M, Zhang ZS, Allen LH Macromolecules, 37(12), 4607, 2004 |
6 |
Thin-film differential scanning nanocalorimetry: heat capacity analysis Efremov MY, Olson EA, Zhang M, Lai SL, Schiettekatte F, Zhang ZS, Allen LH Thermochimica Acta, 412(1-2), 13, 2004 |
7 |
Glass transition of thin films of poly(2-vinyl pyridine) and poly(methyl methacrylate): nanocalorimetry measurements Efremov MY, Olson EA, Zhang M, Allen LH Thermochimica Acta, 403(1), 37, 2003 |
8 |
Thin-film differential scanning calorimetry: A new probe for assignment of the glass transition of ultrathin polymer films Efremov MY, Warren JT, Olson EA, Zhang M, Kwan AT, Allen LH Macromolecules, 35(5), 1481, 2002 |
9 |
Nanoscale calorimetry of isolated polyethylene single crystals Kwan AT, Efremov MY, Olson EA, Schiettekatte F, Zhang M, Geil PH, Allen LH Journal of Polymer Science Part B: Polymer Physics, 39(11), 1237, 2001 |
10 |
Channeling-induced asymmetric distortion of depth profiles from polycrystalline-TiN/Ti/TiN(001) trilayers during secondary ion mass spectrometry Ramanath G, Greene JE, Petrov I, Baker JE, Allen LH, Gillen G Journal of Vacuum Science & Technology B, 18(3), 1369, 2000 |