검색결과 : 2건
No. | Article |
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1 |
Trans-capacitance modeling in junctionless gate-all-around nanowire FETs Jazaeri F, Barbut L, Sallese JM Solid-State Electronics, 96, 34, 2014 |
2 |
Analysis of defect capture cross sections using non-radiative multiphonon-assisted trapping model Garetto D, Randriamihaja YM, Zaka A, Rideau D, Schmid A, Jaouen H, Leblebici Y Solid-State Electronics, 71, 74, 2012 |