화학공학소재연구정보센터
검색결과 : 65건
No. Article
1 Coupling in ATP synthesis: Test of thermodynamic consistency and formulation in terms of the principle of least action
Nath S
Chemical Physics Letters, 723, 118, 2019
2 Jets of boiling-up water injected by a short slit nozzle
Reshetnikov AV, Busov KA, Mazheiko NA, Skokov VN
International Journal of Heat and Mass Transfer, 130, 523, 2019
3 Suppression of contact noise in a study on 1/f noise as a function of film thickness in Al-doped ZnO
Achahour A, Leroy G, Vandamme LKJ, Ayachi B, Duponchel B, Waldhoff N, Blary K, Vilcot JP
Thin Solid Films, 645, 70, 2018
4 Structural mechanism underlying regulation of human EFhd2/Swiprosin-1 actin-bundling activity by Ser183 phosphorylation
Park KR, An JY, Kang JY, Lee JG, Lee Y, Mun SA, Jun CD, Song WK, Eom SH
Biochemical and Biophysical Research Communications, 483(1), 442, 2017
5 Phosphorylation of rat brain purified mitochondrial Voltage-Dependent Anion Channel by c-Jun N-terminal kinase-3 modifies open-channel noise
Gupta R
Biochemical and Biophysical Research Communications, 490(4), 1221, 2017
6 Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part I: Theory and methodology
Boudier D, Cretu B, Simoen E, Carin R, Veloso A, Collaert N, Thean A
Solid-State Electronics, 128, 102, 2017
7 Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs: Part II: Measurements and results
Boudier D, Cretu B, Simoen E, Carin R, Veloso A, Collaert N, Thean A
Solid-State Electronics, 128, 109, 2017
8 Hydrodynamic response to explosive boiling-up in a jet of superheated water
Reshetnikov AV, Mazheiko NA, Skokov VN, Koverda VP
International Journal of Heat and Mass Transfer, 85, 965, 2015
9 Methodology for 1/f noise parameter extraction for high-voltage MOSFETs
Mavredakis N, Pflanzl W, Seebacher E, Bucher M
Solid-State Electronics, 103, 202, 2015
10 Impact of processing and back-gate biasing conditions on the low-frequency noise of ultra-thin buried oxide silicon-on-insulator nMOSFETs
Kudina V, Garbar N, Simoen E, Claeys C
Solid-State Electronics, 105, 37, 2015