검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
REM studies of the roughening transitions of Si high index surfaces Suzuki T, Minoda H, Tanishiro Y, Yagi K Thin Solid Films, 343-344, 423, 1999 |
| 2 |
Nanometer fabrication using selective thermal desorption of SiO2 induced by focused electron beams and electron beam interference fringes Fujita S, Maruno S, Watanabe H, Ichikawa M Journal of Vacuum Science & Technology B, 16(5), 2817, 1998 |
| 3 |
XPS studies on the oxidation behavior of SiC particles Sreemany M, Ghosh TB, Pai BC, Chakraborty M Materials Research Bulletin, 33(2), 189, 1998 |
| 4 |
A Comparative-Study of N(+)/P Junction Formation for Deep-Submicron Elevated Source/Drain Metal-Oxide-Semiconductor Field-Effect Transistors Sun J, Bartholomew RF, Bellur K, Srivastava A, Osburn CM, Masnari NA, Westhoff R Journal of the Electrochemical Society, 144(10), 3659, 1997 |
| 5 |
In-Situ Monitoring and Characterization of SiC Interface Formed in Carbon-Films Grown by Pulsed-Laser Deposition Samano EC, Soto G, Valenzuela J, Cota L Journal of Vacuum Science & Technology A, 15(5), 2585, 1997 |
| 6 |
Pseudomorphic Si1-Ycy and Si1-X-Ygexcy Alloy Layers on Si Eberl K, Brunner K, Winter W Thin Solid Films, 294(1-2), 98, 1997 |
| 7 |
Microscopic Surface-Structures and Macroscopic Thin-Film Morphology Oshiyama A, Yu BD Thin Solid Films, 272(2), 364, 1996 |
| 8 |
Step Site Bonding on a Vicinal Si(100) Surface upon Cl-2 Adsorption Dohnalek Z, Gao Q, Choyke WJ, Yates JT Journal of Chemical Physics, 102(7), 2946, 1995 |
| 9 |
Resi2 Thin-Film Infrared Detectors Becker JP, Mahan JE, Long RG Journal of Vacuum Science & Technology A, 13(3), 1133, 1995 |
| 10 |
Na/Carbon-Rich Beta-SiC(100) Surface - Initial Interface Formation and Metallization Semond F, Soukiassian P, Mangat PS, Dicioccio L Journal of Vacuum Science & Technology B, 13(4), 1591, 1995 |