| 초록 |
Diblock copolythiophene was studied using grazing incidence small angle and wide angle X-ray scattering for the quantitative analysis range from few tens of nanometer scale to angstrom scale. The thin films of block copolythiophene formed vertically oriented lamellar structure and both block domains show self-assembled multi-layered stacking along a direction normal to substrate. These results is well-agreed with analysis of DSC, UV, AFM and TEM. The crystalline blocks show the π−π stacked thiophene backbones along in-plane direction as well as multi-layered structures. However, the amorphous blocks displayed no specific molecular interaction because of flexible side moieties. In conclusion, we successfully develop the well-controlled structures of π conjugated diblock copolymer in thin films for the various applications. |
