| 학회 |
한국고분자학회 |
| 학술대회 |
2018년 가을 (10/10 ~ 10/12, 경주컨벤션센터) |
| 권호 |
43권 2호 |
| 발표분야 |
고분자구조 및 물성: 극한물성소재 |
| 제목 |
Wrinkling based metrology for estimation of crystallinity of semi-crystalline polymeric thin film |
| 초록 |
The degree of crystallization of polymeric thin film is highly challenge to quantify since the conventional characterization methods of polymers are not generally applicable to thin film system. To address this challenge, we present a method for estimating the crystallinity of semi-crystalline polymeric thin films (＜500nm) using wrinkling based metrology. In this system crystallinity is estimated by measuring wavelength of wrinkled surface and calculating the modulus of each constituting layers. Then the crystallinity is calculated by equation which represents the relation of modulus and crystallinity. To realize this system, polyvinyl alcohol (PVA) was employed as semi-crystalline polymer which the crystallinity was modulated by cooling rate after annealing, and PVA/Al system was used to generate surface wrinkle. We believe that this approach would be useful for elucidating the crystallinity and mechanical properties of semi-crystalline polymer. |
| 저자 |
유성수, 유필진
|
| 소속 |
성균관대 |
| 키워드 |
Semi-crystalline; Crystailinity; PVA; Thin film; Wrinkling
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| E-Mail |
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