| 학회 | 한국화학공학회 |
| 학술대회 | 2008년 봄 (04/23 ~ 04/25, 제주ICC) |
| 권호 | 14권 1호, p.1282 |
| 발표분야 | 재료 |
| 제목 | Thermal Effects on Domain Orientation of Tetragonal Piezoelectrics Studied by In-situ X-ray Diffraction |
| 초록 | Thermal effects on domain orientation in tetragonal lead zirconate titanate (PZT) and lead titanate (PT) have been investigated by using in-situ X-ray diffraction (XRD) with an area detector. In the case of a soft PZT, it is found that the texture parameter called multiples of a random distribution (MRD) initially increases with temperature up to approximately 100°C and then falls to unity at temperatures approaching the Curie temperature, whereas the MRD of hard PZT and PT initially undergoes a smaller increase or no change. The relationship between the mechanical strain energy and domain wall mobility with temperature is discussed. This research was supported by the U.S. National Science Foundation under award numbers DMR-0224991. |
| 저자 | 장원영1, 이중기1, Alexander H. King2, Keith J. Bowman3 |
| 소속 | 1한국과학기술(연), 2Ames National Laboratory, 3Purdue Univ. |
| 키워드 | In-situ XRD; Piezoelectrics; Texture; Thermal Depoling |
| 원문파일 | 초록 보기 |
