| 학회 |
한국고분자학회 |
| 학술대회 |
2013년 봄 (04/11 ~ 04/12, 대전컨벤션센터) |
| 권호 |
38권 1호 |
| 발표분야 |
분자전자 부문위원회 |
| 제목 |
The electrical reliability of organic field-effect transistors with various polymer dielectrics |
| 초록 |
The electrical reliability of organic field-effect transistors (OFETs) is critical issue for the long-term operation and their commercialization. We can demonstrate that the electrical properties of OFETs by bias stress. In case of OFETs, recent studies have demonstrated that charge trapping is occurred in the semiconductor and gate dielectric interface. Also, they report that most of the trapped charges are in gate dielectric not in semiconductor. In this study, the bias stress stabilities of OFETs with various polymer gate dielectrics are investigated in order to demonstrate effect of polymer characteristics. Under bias stress, the drain current decay and the threshold voltage shift are found to different as polymer characteristics without changes mobilities of OFETs. |
| 저자 |
김지예, 안태규, 박선욱, 김래호, 김유진, 박찬언
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| 소속 |
포항공대 |
| 키워드 |
Organic field-effect transistors; Gate dielectric; Bias-stress
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| E-Mail |
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