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Highly reliable and low-energy operation by “Erase-free” based multi-bit performance in a HfO2 resistive switching device Jin joo Ryu, Chunjoong Kim, Gun Hwan Kim 한국재료학회 2019년 봄 학술대회 |
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Highly reliable and low-energy operation by “Erase-free” based multi-bit performance in a HfO2 resistive switching device Jin joo Ryu, Chunjoong Kim, Gun Hwan Kim 한국재료학회 2019년 봄 학술대회 |