The adhesion of Ta, TaN (cubic), TaNx (mixture of cubic and amorphous phases), and Cr to 3,3＇,4,4＇-biphenylene tetracarboxylic acid dianhydride-p-phenylenediamine-derived polyimide (BPDA-PDA PI) has been characterized. The PI surface was subjected to CF4-reactive ion etching (RIE) and Ar-sputtering prior to interface preparation. The peel adhesion at T-0 (initial) shows the following order: TaNx similar to TaN < Ta similar to Cr, with all samples failing in apparently virgin PI. After ten thermal cycles to 400 degrees C in forming gas the peel adhesion showed the following trend: TaNx similar to TaN similar to Ta similar to Cr, whereas if the annealing was done in N-2 the order changed to TaNx similar to TaN << Ta < Cr. The peel locus of failure was always in the apparently virgin PI in the Cr/PI samples, while the Ta/PI samples failed in the modified PI, and the TaN/PI and TaNx/PI samples failed between the Ta-nitride and the Cu peel backing him after thermal cycling.