Metal-induced crystallization method is one of the favorable non-laser crystallization methods for thinfilm transistors in large-area displays. However, it is necessary to reduce metal contamination in the film to lower leakage current for the device applications. A new two-step crystallization method, consisting of a nucleation step by AlCl3 vapor-induced crystallization and a grain growth step by a pulsed rapid thermal annealing, has been proposed to increase the grain size and reduce the residual metal contamination in crystallized poly-Si films. The grain size of the poly-Si film crystallized by the VIC + PRTA two-step crystallization process was as large as 70 mu m. Furthermore, the Al concentration in the poly-Si film was reduced by two orders of magnitude from 1 x 10(20) cm(-3) by VIC only process to 1.4 x 10(18) cm(-3) by the two-step process. As a result, the minimum leakage current of poly-Si TFTs using the poly-Si film prepared by the two-step process was reduced from 1.9 x 10(-10) A/mu m to 2.8 x 10(-11) A/mu m at a drain voltage of 5 V, without carrier mobility degradation. (C) 2012 Elsevier B.V. All rights reserved.