Polyvinyl alcohol (PVA)/(Co-Ni) nanofiber film was fabricated on silicon wafer using electrospinning technique. The topography of the produced PVA/(Co-Ni) nanofiber film was examined by scanning electron microscopy (SEM). The Au/Poly (vinyl alcohol) (Co, Ni-doped)/n-Si Schottky diode (SD) was thermally formed in evaporating system after the spinning process. At first, the currentvoltage (IV) characteristics of Au/PVA (Co, Zn-doped)/n-Si SD was measured at the room temperature (300 K). For the investigating the effect of temperature, illumination and radiation on Au/PVA (Co, Zn-doped)/n-Si SD comparatively, the measurement was performed under the illumination intensity of 200 W, at 380K, and finally the radiation dose of 22 kGy respectively. The diode characteristics such as the zero-bias barrier height (?Bo), ideality factor (n) and series resistance (Rs) were calculated at room temperature and under the condition of high temperature, illumination, and radiation. It was found that these characteristics were affected by the illumination and radiation as well as the temperature. The density of interface states (Nss) distribution profiles as a function of (Ec - Ess) extracted from the forward IV measurements were also affected by illumination and radiation even if just a bit. (c) 2012 Wiley Periodicals, Inc. J Appl Polym Sci, 2012