Ce:LiSrAlF6 and Eu:LiSrAlF6 crystals with different dopant concentrations were grown by the micro-pulling-down method. The crystals with high dopant crystal included the secondary phase as clusters with the plate shape in BSE images. The secondary phases were identified CeF3 and EuF2, respectively, by the EDS analysis and powder-XRD measurement. Eu concentration against the Sr sites in the Eu 2% doped LiSAF crystal were most uniform in the range 0.9-1.6 atm% using the EPMA. (C) 2012 Elsevier B.V. All rights reserved.