In this article, it is shown that the Van der Pauw (VDP) method, generally known in microelectronics, can be successfully adapted to sheet resistance measurements of electroconductive fabrics. We prepared two polypyrrole-coated woven para-aramide fabrics and used a simple setup to measure their sheet resistances. The results were then compared with those obtained using a sophisticated commercial collinear array probe. The measurements were done in a 1 month interval, to investigate the influence of the coating aging on the sheet resistance of the samples. The influence of the contact positioning on the accuracy of the VDP measurement was investigated. (C) 2010 Wiley Periodicals, Inc. J Appl Polyrn Sci 117: 2553-2558,2010