화학공학소재연구정보센터
Advanced Materials, Vol.22, No.10, 1156-1156, 2010
Probing Interfacial Electronic Structures in Atomic Layer LaMnO3 and SrTiO3 Superlattices
The interfacial electronic structure characterization of a mx(LaMnO3)/nx(SrTiO3) superlattice based on scanning transmission electron microscopy and electron energy loss spectroscopy. Evidence of interfacial band alignment and electron transfer are presented based on the observation of O K edge of individual transition metal and oxygen atomic columns. Electron probe aberration correction was essential for the high spatial resolution mapping of interfacial electronic states.