Multilayered BaTiO3(BTO)/Bi0.5K0.5TiO3 (BKT) thin films have been fabricated on Pt/Ti/SiO2/Si substrates using a metalloorganic decomposition process. XRD investigation of the resultant BTO/BKT multilayered thin films shows that they retain a perovskite-related structure type. They also exhibit a well-defined, polarization-electric field hysteresis loop with a measured remnant polarization (2P(r)) of 5 mu C/cm(2) at an applied electric field of 250 kV/cm. The measured dielectric constant and dielectric loss at 10 kHz is 470 and 0.07 respectively. These multilayer BTO/BKT films maintain an excellent fatigue-free character even after 10(9) switching cycles. The mechanism associated with the enhancement of the electrical properties of the synthesized BTO/BKT films is also discussed. Crown Copyright (c) 2009 Published by Elsevier B.V. All rights reserved.