화학공학소재연구정보센터
Journal of the Electrochemical Society, Vol.157, No.3, H301-H303, 2010
Optical and Electrical Characterization of Silver Microflake Colloid Films
A conductive, diffuse reflector fabricated from a silver microflake colloid is introduced. When sintered at relatively low temperatures of similar to 400 degrees C, the reflectance of the colloid film is 99.6% diffuse over wavelengths ranging from 300 to 1400 nm. The diffuse reflectance characteristic of the sintered colloid arises from its porous structure, which closely mimics the structure of the nearly ideal Lambertian reflectors that are fabricated using packed/sintered polytetrafluoroethylene particles and are widely used in optical instruments. Because diffuse rear reflectors are useful for enhancing the optical absorption of solar cells, the characteristics of silver colloid reflectors on silicon substrates are also examined. With either 400 degrees C sintering or room-temperature drying, the colloid reflector exhibits a reflectance of similar to 96% with an similar to 15% higher diffuse component than a conventional silver paste of similar reflectance. In addition, the electrical resistivities of both the sintered and room-temperature dried silver colloid films are comparable to that of high temperature (similar to 750 degrees C) fired screen-printed aluminum and silver pastes.