It has been a number of years since phase-sensitive specular neutron reflectometry (PSNR) methods employing reference layers were first introduced to help remove the ambiguity inherent in the reconstruction of scattering length density (SLD) depth profiles (Majkrzak, C. F.; Berk, N. F. Physica B 2003, 336, 27) from specular reflectivity measurements. Although a number of scientific applications of PSNR techniques have now been successfully realized (Majkrzak, C. F.; Berk, N. F.; Perez-Salas, U. A. Langmuir 2003, 19, 7796 and references therein), in certain cases practical difficulties remain. In this article, we describe possible solutions to two specific problems: (1) the need for explicit, detailed knowledge of the SLD profile of a given reference layer of finite thickness; and (2) for a reference layer of finite thickness in which only two density variations are possible, how to identify which of two mathematical solutions corresponds to the true physical structure.