Compounds containing rare earths are of increasing technological interest especially because of their unique mechanical, magnetic, electrical, and optical properties. Among them, rare earth oxyorthosilicates are attractive scintillators for gamma- and X-ray spectroscopy and detection. However, there are many structural aspects of those compounds that are not clear. In this research, the structure parameters for Sc2Si2O5, X-2-polymorph, have been refined from powder X-ray diffraction (XRD) data and the Si-29 MAS NMR spectrum is reported for the first time. X-2-Sc2SiO5 polymorph was synthesized by the sol-gel method and characterized by XRD and Si-29 MAS NMR. The XRD pattern was indexed in a monoclinic unit cell with space group I2/c; the resulting unit cell parameters were a=9.9674(2) angstrom, b=6.4264(9) angstrom, c=12.0636(2) angstrom, and beta=103.938(1)degrees. The Si-29 MAS NMR spectrum showed a unique signal at -79.5 ppm, compatible with the unique Si crystallographic site in the unit cell. Finally, the band valence method has been applied to the calculation of a "shift parameter," which is correlated with the NMR chemical shift.