Utilizing BCl3 reaction on Ge(1 0 0) and subsequent Si epitaxial growth by SiH4 reaction at 300 degrees C, B atomic-layer doping in Si/Ge(1 0 0) heterostructure was investigated. Cl atoms on the B atomic-layer formed Ge(1 0 0) scarcely affect upon the SiH4 reaction. It is also found that Si atom amount deposited by SiH4 reaction on Ge(1 0 0) is effectively enhanced by the existence of B atomic layer and the deposition rate tends to decrease at around 2-3 atomic layers which is three times larger than that in the case without B. The results of angle-resolved X-ray photoelectron spectroscopy show that most B atoms are incorporated at the heterointerface between the Si and Ge. (c) 2008 Elsevier B.V. All rights reserved.