Previous Article Next Article Table of Contents Journal of Crystal Growth, Vol.310, No.7-9, 1674-1678, 2008 DOI10.1016/j.jcrysgro.2007.11.042 Export Citation Growth, annealing and thermo-electrical properties of Cd1-xZnxS thin films for microbolometers Stolyarova S, Weinstein M, Nemirovsky Y Cd1-xZnxS (0 Keywords:AFM;thin films;sulfides;semiconducting cadmium compounds;microbolometer Please enable JavaScript to view the comments powered by Disqus.
