The effect of condensed water on pull-off forces under high vacuum (HV) and 0 to 83% relative humidity (RH) N-2 atmospheric conditions was evaluated for different contact geometries using atomic force microscopy (AFM). The pull-off force was measured using two types of contact geometry: contact between hemispherical asperities and a flat silicon probe on an AFM cantilever (called a spherical-flat contact) and between a flat silicon substrate and a flat nickel probe on an AFM cantilever (called a flat-flat contact). The hemispherical asperities were fabricated using a focused ion beam (FIB) system, and each peak had a radius of curvature of between 70 and 6 10 nm. The flat nickel probe was fabricated by friction-induced wear. Measurement results showed that for the spherical-flat contact the pull-off force was proportional to the radius of curvature of the asperity peak and was slightly lower in HV than in humid 14% RH N-2. For the flat-flat contact in HV, with increasing contact time, the pull-off force increased in HV but decreased in humid 62 and 83% RH N-2. The pull-off force in HV was lower than that in humid N-2 when the contact time was less than 10 s but was higher when the contact time was longer than 30 s. The estimated adhesion force based on the Laplace pressure from the contact geometry agreed reasonably well with the measured pull-off force.