Journal of Vacuum Science & Technology B, Vol.25, No.6, 1799-1803, 2007
Proposed single layer composite film used as high transmission phase shifting masks for the 32, 45, and 65 nm technology nodes
The optical constants of composite films are linearly dependent on their mole fraction. The (Al2O3)(x)-(TiO2)(1-x) composite films prepared by using rf unbalanced magnetron sputtering are completely oxidized using an O-2/Ar flow rate ratio of 2.0. By tuning the Al2O3 mole fraction of (Al2O3)(x)-(TiO2)(1-x) composite films, the optical constants can be made to meet the optical requirements for a high transmittance attenuated phase shifting mask (HT-AttPSM) blank. It can be seen that the Al2O3 mole fraction in (Al2O3)(x)-(TiO2)(1-x) composite films which would best meet the optical requirements of a HT-AttPSM blank in ArF (immersion) lithography is calculated to be between 78% and 86%. In order to obtain a HT-AttPSM blank with an optimized transmittance of 20%, one Al2O3-TiO2 composite film is fabricated. All the films meet the requirements of the adhesion test and surface roughness for HT-AttPSM applications. Therefore, a single layer composite film of Al2O3-TiO2 could be applied to HT-AttPSM blanks, which can be utilized to design fine patterns with dimensions as small as 65, 45, and 32 nm. (C) 2007 American Vacuum Society.