Journal of the American Ceramic Society, Vol.90, No.8, 2404-2408, 2007
Sintering and dielectric characterization of pseudoternary compounds from the Bi2O3-TiO2-TeO2 system
Using X-ray diffraction analysis, scanning electron microscopy, thermogravimetry, and measurements of the dielectric properties up to the MW frequency range, the characterization of Bi2Ti3TeO12, Bi2TiTeO8, and Bi6Ti5TeO22 compounds, which all include Te6+, was performed. As the processes of Te6+ reduction and the evaporation of TeO2-containing species contribute to the presence of secondary phases, the preparation of single-phase ceramics is rather difficult. To minimize the amount of secondary phases during the firing process, the pellets were muffled in a corresponding compound and then fired in an antoclave furnace under 10 bars of oxygen pressure. By sintering the Bi2Ti3TeO12, Bi2TiTeO8, and Bi6Ti5TeO22 between 840 degrees and 1010 degrees C, ceramics with epsilon(r) ranging from 36 to 350, Q x f values from 220 to 12500 GHz, and tau(f) from +41 to +2600 ppm/K were obtained.