Solid-State Electronics, Vol.46, No.4, 505-512, 2002
Determination of semiconductor resistance under a contact
In this work the expression for end resistance has been modified for the case of finite metal resistance. It has been shown that using this approach the contact resistivity for alloyed contacts can be determined even in case of small transfer length and large contact length. This is contrary to the case where metal resistance is assumed to be zero. The changes required for different probe positions have also been considered. (C) 2002 Elsevier Science Ltd. All rights reserved.