Interfacial structure of laminated polyethylene (PE)/polypropylene (PP) films was investigated by synchrotron X-ray microbeam. The X-ray microbeam (0.9 mu m (vertical) x 1.7 mu m (horizontal)) formed using a phase zone plate was irradiated on the cross-section of the laminated films. In order to irradiate X-ray microbeam in the direction perpendicular to the cross-section of the film sample, adjustment of the sample setting was performed by Thomson scattering method. The Thomson scattering intensity is proportional to the number of the irradiated electrons, so the irradiated position of the X-ray microbeam could be determined from the intensity profile with high spatial resolution. By changing the sample position, diffraction patterns could be obtained from the laminated films across the PE/PP interfacial region. The thickness of the interfacial region of the annealed laminate was estimated as 5 mu m judging from the changes of the diffraction intensities from the PE crystallites to the PP ones. The interfacial thickness depended on the thermal treatment of the film. It was found that the adhesion strength of the PE/PP laminate increased with increasing the interfacial thickness. Both of PE and PP chains entangled each other during laminate processing. The entangled molecular chains play important role as anchoring effect at the PE/PP interdiffusion region. However, the phase separation progressed with further crystallization by annealing. Thus, the adhesion strength of the PE/PP laminate was considered to be influenced by the interfacial thickness.