Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy

Shi DX; Song YL; Zhu DB; Zhang HX; Xie SH; Pang SJ; Gao HJ

Advanced Materials, Vol.13, No.14, 1103-1103, 2001

DOI10.1002/1521-4095(200107)13:14<1103::AID-ADMA1103>3.0.CO;2-B Export Citation

Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy

Shi DX, Song YL, Zhu DB, Zhang HX, Xie SH, Pang SJ, Gao HJ

A data storage density of at least 10(14) bits/cm(2) is possible using p-nitrobenzonitrile as the data storage medium and scanning tunneling microscopy (STM) as the recording method. This represents the smallest mark size among all the organic thin films studied by these authors. The figure shows a typical STM image of a recorded pattern.