Previous Article Next Article Table of Contents Advanced Materials, Vol.12, No.2, 91-94, 2000 DOI10.1002/(SICI)1521-4095(200001)12:2<91::AID-ADMA91>3.0.CO;2-A Export Citation Principle of low-energy electron beam-induced current imaging for ferroelectric thin films Lubomirsky I, Wang TY, Gartsman K, Stafsudd OM Please enable JavaScript to view the comments powered by Disqus.
