Previous Article Next Article Table of Contents Advanced Materials, Vol.3, No.1, 32-38, 1991 DOI10.1002/adma.19910030107 Export Citation OPTICAL AND SURFACE-ANALYTICAL METHODS FOR THE CHARACTERIZATION OF ULTRATHIN ORGANIC FILMS BUBECK C, HOLTKAMP D Keywords:SIMS;INFRARED SPECTROSCOPY;RAMAN SPECTROSCOPY;NONDESTRUCTIVE ANALYSIS Please enable JavaScript to view the comments powered by Disqus.
