화학공학소재연구정보센터
Applied Surface Science, Vol.252, No.5, 1765-1771, 2005
Characterization of DNA chips on the molecular scale before and after hybridization with an atomic force microscope
Using two different 25-mer oligonucleotide probes covalently grafted on a silicon substrate, we demonstrate how efficient atomic force microscopy (AFM) can be for monitoring each step of DNA chip preparation: from probe immobilization to hybridization on the molecular scale. We observed the probe-molecule organization on the chip after immobilization, and the target molecules, which hybridized with probes could be individually identified. This article presents a method of straightforwardly identifying not only single and double DNA strands, but also, and more significantly, the hybridized part on them. (c) 2005 Elsevier B.V. All rights reserved.