Applied Surface Science, Vol.211, No.1-4, 227-235, 2003
Spectral analysis of the low energy Auger emission from a (0001) ruthenium surface
The low energy Auger emission from a Ru(0 0 0 1) surface have been analysed by means of a cylindrical mirror analyser (CMA) within the range of the electron energy (E) from 27 to 37 eV as a function of the primary electron energy (E-p), which was set from 170 to 450 eV in 20 eV steps. Three Auger transitions at following energies: 31.7, 33.8 and 36.4 eV, have been found due to application of the backscattering generation factor idea. Obtained results for the Auger transitions were verified by means of XPS results published by Fuggle et al. (C) 2003 Elsevier Science B.V. All rights reserved.
Keywords:Auger electron spectroscopy (AES);true secondary electron emission (TSEE);Auger electron emission generation factor;AES backscattering electron corrections;ruthenium (Ru)