Applied Surface Science, Vol.203, 793-797, 2003
High precision isotope micro-imaging of materials
Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly. developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4% enrichment of O-16 in spinel particles embedded in melilite from a Ca-Al-rich inclusion of, a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research. (C) 2002 Elsevier Science B.V. All rights reserved.