Journal of Crystal Growth, Vol.297, No.1, 7-9, 2006
Nanostructure characterization of (SmS)(1.19)TaS2 by means of STM/STS
Layered transition-metal dichalcogenide (LTMD) materials have been studied extensively. These materials can be easily intercalated with different elements due to their layered structure. This report shows the results of scanning tunneling microscopy and spectroscopy (STM/S) investigations of (SmS)(1.19)TaS2 misfit-layer compound. This compound is composed of two trigonal triple layers of S-Ta-S separated from one another by the SmS double layer. The structure of SmS layers exhibits square symmetry contrary to the trigonal TaS2 host structure. The observed lattice symmetry suggests that the SmS layer was exposed due to cleavage process made before measurements. The I-V characteristics measured above the sample surface showed metallic-like behavior of this material. (c) 2006 Elsevier B.V. All rights reserved.