Journal of Crystal Growth, Vol.249, No.3-4, 600-613, 2003
Morphology of and dislocation movement in n-C40H82 paraffin crystals grown from solution
Ex situ atomic force microscopy, supplemented with in situ optical microscopy, was applied to the {001} surface of n-C40H82 paraffin crystals grown from n-hexane solution. Platelets of monomolecular thickness, small ultra-thin crystals originating from one or two growth spiral(s), as well as aggregates of thicker crystals were found. The monomolecular plates are the actual growth form of perfect n-paraffin crystals, the growth of which is determined by one- and two-dimensional nucleation. Owing to post-growth stresses acting on the thin crystals slip movement by screw dislocations occurred, which is visible as crossing of as-grown and post-growth steps on the crystal surface. The shear stresses for dislocation movement result from adhesion forces acting on the crystals after evaporation of the liquid. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords:atomic force microscopy;characterization;crystal morphology;line defects;surface structure;organic compounds