Journal of Crystal Growth, Vol.214, 284-288, 2000
Lateral grain size and electron mobility in ZnO epitaxial films grown on sapphire substrates
We have fabricated ZnO thin films on sapphire substrates at temperatures ranging from 350 to 1000 degrees C by laser molecular-beam epitaxy. With increasing growth temperature, lateral grain size evaluated by X-ray reciprocal space mapping increased resulting in improved electron mobility. When the film was grown at 1000 degrees C, an electron mobility as large as 90 cm(2)/Vs was achieved. By annealing in 1 atm of oxygen at 1000 degrees C, thin films having much larger grain size (> 5 mu m(2)) and higher mobility(similar to 120 cm(2)/V s) comparable with those for bulk single crystals could be obtained.
Keywords:ZnO films;laser molecular-beam epitaxy;lateral grain size;mosaicness;electron mobility;X-ray reciprocal space mapping