Materials Chemistry and Physics, Vol.66, No.1, 17-21, 2000
Growth, phase analysis and mechanical properties of InSb1-xBix crystals
InSb1-xBix crystals with x varying from 0 to 0.06 were grown by vertical Bridgman technique. The grown crystals were characterised by X-ray diffraction method for phase analysis and for the measurement of lattice parameter. The solubility of InBi in InSb was determined using differential thermal analysis. Chemical etching and microhardness studies were carried out on the grown crystals.