Journal of the American Ceramic Society, Vol.89, No.2, 557-561, 2006
Characterization of MgTiO3-CaTiO3-layered microwave dielectric resonators with TE01 delta mode
MgTiO3 and CaTiO3 ceramics were stacked in different schemes as the key components of the microwave dielectric resonators, and the microwave dielectric characteristics were evaluated with TE01 delta resonant mode. With increasing thickness fraction of CaTiO3, the resonant frequency and Q x f value decreased, while the effective dielectric constant and temperature coefficient of resonant frequency increased. The microwave dielectric characteristics were also affected by the stacking scheme. These effects were analyzed by the finite-element method, and the predicted characteristics agreed well with the experimental results. It was indicated that the temperature-stable resonators with high-Q x f values could be attained by changing the thickness fractions of CaTiO3, and the corresponding microwave dielectric characteristics could also be predicted by the finite-element method.