Journal of the American Ceramic Society, Vol.86, No.6, 969-974, 2003
Aluminum silicate films obtained by low-pressure metal-organic chemical vapor deposition
Amorphous alumina-silica films with film thickness of 0.41-2.69 mum were prepared on glass and silicon substrates by metal-organic chemical vapor deposition using a mixture of aluminum tri-sec-butoxide (ATSB), hexamethyldisilazane (HMDSN), and argon. By controlling the inputs of ATSB and HMDSN, alumina-silica thin films could contain varied compositions and adjustable properties. Basically, the codeposition of alumina and silica to form alumina-silica using ATSB and HMDSN had a faster growth rate than their individual components. The internal stress could be adjusted by deposition temperature and reactant inputs. Adhesion could be improved by having a silicon-rich thin Him, whereas an aluminum-rich film could have slightly higher hardness. Optical properties, e.g., refractive index and optical transmittance, were also measured.