The processing conditions, microstructure, and dielectric properties of strontium bismuth niobate vanadate ceramics, SrBi2(VxNb1-x)(2)O-9 (SBVN, with 0 less than or equal to x less than or equal to 0.3), were systematically studied. A relative density of > 90% was obtained for all the samples using a two-step sintering process. XRD showed that a single phase with the layered perovskite structure of SrBi2Nb2O9 (SBN) was formed with a vanadium content of up to 30 at.%. SEM revealed that the average grain size decreased gradually with an increase in vanadium content. The Curie point was found to gradually increase from similar to 418 degreesC for SBN to similar to 459 degreesC for SBVN with 30 at.% vanadium. Dielectric constants at room temperature and their respective Curie points were found to peak at a composition with 10-15 at.% vanadium. Moreover, a high concentration of vanadium (>5 at.%) resulted in a significant increase in tangent loss at low frequencies (< 1000 Hz). The relationships between chemical composition, processing condition, microstructure, and dielectric properties of SBVN ferroelectric ceramics are discussed.