Microcontacts on adjacent grains of polycrystalline Fe-doped SrTiO3 samples have been used to locally investigate the properties of individual grain boundaries. Impedance spectroscopy was employed to separate bulk and grain boundary impedances. Experiments at about 30 different grain boundaries permit far-reaching conclusions on the distribution of grain boundary resistances, capacitances, and peak frequencies measured between adjacent grains. The rather narrow distribution of the grain boundary peak frequencies indicates a narrow distribution of grain boundary resistivities. All features (e.g., nonlinear current-voltage characteristics, grain boundary thickness, temperature dependence) are in accordance with the assumption of space charge depletion layers (double Schottky barriers) as the origin of the enhanced grain boundary resistivity, The average barrier height measured was about 630 mV. For comparison conventional (macroscopic) impedance measurements on a polycrystal were also performed and a brick layer model was used to extract effective properties. The reasonable agreement between these effective parameters and the average of the locally obtained parameters demonstrates that, in this case, a brick layer analysis of conventional impedance experiments yields satisfying estimates of the grain boundary properties.