Experiments were conducted on electrodeposited (ED) nanocrystalline (nc) Ni with an average initial grain size of about 20 nm at 393 K to study the shape of the creep curves. In addition, microstructure was examined by means of transmission electron microscopy (TEM). The results show that the creep curves are characterized by the presence of a well-defined steady-state stage. An examination of the microstructure indicates that while grain growth occurs during deformation, the grain size attains a constant value once steady state creep is approached. A comparison between grain size measurements obtained by the TEM technique and those obtained via the X-ray diffraction method shows that the use of the latter method may lead to an underestimation of the value of the average grain size.