Chemical Reviews, Vol.96, No.4, 1261-1290, 1996
Atomically-Resolved Studies of the Chemistry and Bonding at Silicon Surfaces
Keywords:SCANNING-TUNNELING-MICROSCOPY;CHEMICAL-VAPOR-DEPOSITION;ENERGY ELECTRON-DIFFRACTION;SUCCESSIVE OXIDATION STAGES;SATURATED SI(100) SURFACE;ULTRATHIN OXIDE LAYERS;PI-BONDED DIMERS;EPITAXIAL-GROWTH;HYDROGEN DESORPTION;LOW-PRESSURE